Yokohama, Japan

Yasunori Ishizu

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Mitsubishi Power, Ltd.. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yasunori Ishizu. Retrieved from https://idiyas.com/inventor/yasunori-ishizu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Yasunori Ishizu: Innovator in Device Abnormality Diagnosis

Introduction

Yasunori Ishizu is a notable inventor based in Yokohama, Japan. He has made significant contributions to the field of device abnormality diagnosis, showcasing his expertise through his innovative patent.

Latest Patents

Yasunori Ishizu holds a patent for a "Device Abnormality Diagnosis Method and Device Abnormality Diagnosis Device." This invention involves a method for diagnosing abnormalities in devices that are part of a plant. The process includes obtaining time-series data of various state amounts correlated to device abnormalities. It also involves pre-processing this data to exclude information from transient states affected by other devices, ultimately allowing for accurate abnormality diagnosis.

Career Highlights

Yasunori Ishizu is currently employed at Mitsubishi Power, Ltd., where he applies his knowledge and skills to advance technology in the energy sector. His work focuses on enhancing the reliability and efficiency of power generation systems.

Collaborations

Some of his coworkers include Hiroyoshi Kubo and Hiromi Aota, who contribute to the innovative environment at Mitsubishi Power, Ltd.

Conclusion

Yasunori Ishizu's work in device abnormality diagnosis exemplifies the importance of innovation in technology. His contributions are vital for improving the performance and reliability of industrial systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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