The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 2021
Filed:
Sep. 13, 2016
Mitsubishi Hitachi Power Systems, Ltd., Yokohama, JP;
Hiroyoshi Kubo, Tokyo, JP;
Hiromi Aota, Tokyo, JP;
Yasunari Shibata, Yokohama, JP;
Katsuhiko Yokohama, Tokyo, JP;
Yasunori Ishizu, Yokohama, JP;
Yoshinori Koyama, Tokyo, JP;
MITSUBISHI POWER, LTD., Yokohama, JP;
Abstract
A device abnormality diagnosis method for a device to be diagnosed constituting a plant includes: obtaining time-series data of a plurality of state amounts of the plant which are correlated to an abnormality of the device to be diagnosed; a step of obtaining abnormality diagnosis data on the plurality of state amounts by performing pre-processing on at least one state amount of the plurality of state amounts to exclude, from the time-series data on the state amounts, data of the at least one state amount obtained in an exclusion period which is at least a part of a transient state period during which the device to be diagnosed is affected by a state change of another constituent device of the plant; and a step of performing abnormality diagnosis on the device to be diagnosed on the basis of the abnormality diagnosis data of the plurality of state amounts.