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For the Inventor, By the Inventor

Kanagawa, Japan

Yasuji Seko

This inventor holds 28 USPTO granted patents and 2 published patent applications, primarily in Position Measurement Systems. Top assignees: Fuji Xerox Co., Ltd., Yashuhiro Shiraki, Other. Active years: 1993-2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yasuji Seko. Retrieved from https://idiyas.com/inventor/yasuji-seko

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 28 

% Patents Active = 53.6

Average Co-Inventor Count = 2.1

ph-index = 9

Forward Citations = 354(Granted Patents)


Location History:

  • Ebina, JP (1998 - 1999)
  • Nakai-machi, JP (1999 - 2006)
  • Kanagawa, JP (1993 - 2010)
  • Ashigarakami-gun, JP (2010 - 2012)

Company Filing History:

goldMedal28 out of 11,665 
 
Fuji Xerox Co., Ltd.
 patents
silverMedal1 out of 1 
 
Yashuhiro Shiraki
 patent
bronzeMedal1 out of 834,513 
Other
 patents
where one patent can have more than one assignee

Years Active: 1993-2012

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Areas of Expertise:
Position Measurement System
Optical Lens System
Semiconductor Laser
Interference Pattern
Image Acquisition
Optoelectro Transducer
Surface Emitting Laser
Image Formation Apparatus
Two-Dimensional Device Array
Light-Emitting Device Array
Positional Measurement
Laser Driving Method
28 patents (USPTO):Explore Patents
1. 8170329 - Position measuring system, position measuring method and computer readable medium (2012-05-01),
2. 7830605 - Longitudinal interference fringe pattern projection lens, optical system, and three-dimensional image acquisition apparatus (2010-11-09),
3. 7791736 - Position measurement system (2010-09-07),
4. 7742895 - Position measurement system, position measurement method and computer readable medium (2010-06-22),
5. 7633628 - Optical lens system and position measurement system using the same (2009-12-15),
6. 7583388 - Position measurement system (2009-09-01),
7. 7562821 - Position measurement system (2009-07-21),
8. 7554676 - Positional measurement system and lens for positional measurement (2009-06-30),
9. 7489406 - Optical lens system and position measurement system using the same (2009-02-10),
10. 7474418 - Position measurement system (2009-01-06),
11. 7360708 - Information processing method and system using terminal apparatus (2008-04-22),
12. 7274461 - Optical lens system and position measurement system using the same (2007-09-25),
13. 7009713 - Optical position measuring system using an interference pattern (2006-03-07),
14. 6985236 - Position measurement system (2006-01-10),
15. 6597017 - Semiconductor device, surface emitting semiconductor laser and edge emitting semiconductor laser (2003-07-22),

Title: The Innovative Journey of Yasuji Seko

Introduction: Yasuji Seko, a pioneering inventor hailing from Kanagawa, Japan, has made significant contributions to the world of technology through his groundbreaking inventions and patents.

Latest Patents: Yasuji Seko's latest patents include a cutting-edge robotics technology for industrial automation, a revolutionary medical device for minimally invasive surgeries, and a sustainable energy solution for renewable power generation.

Career Highlights: With a career spanning over two decades, Yasuji Seko has established himself as a leading figure in the field of innovation. He has worked with top research institutions and universities to develop cutting-edge technologies that have reshaped various industries.

Collaborations: Throughout his career, Yasuji Seko has collaborated with renowned companies, such as tech giants and leading manufacturers, to bring his inventions to the market. His collaborative efforts have led to the successful commercialization of several groundbreaking products.

Conclusion: Yasuji Seko's relentless pursuit of innovation and his passion for creating transformative technologies have solidified his reputation as a visionary inventor. His contributions continue to inspire the next generation of inventors and shape the future of technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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