Fuji Xerox Co., Ltd.

Other

Yashuhiro Shiraki

Yasuji Seko

Nobuaki Ueki

Hideo Nakayama

Hiromi Otoma

Mario Fuse

Hideki Fukunaga

Yoshinori Yamaguchi

Akemi Murakami

Hiroyuki Hotta

Yasuyuki Saguchi

Hiroyuki Miyake

Kiichi Ueyanagi

Yasuhiro Shiraki

Izumi Iwasa

Tsutomu Abe

Masao Ito

Akira Sakamoto

Kaoru Yasukawa

Hideaki Ashikaga

Kazumasa Murai

Shoji Sakamoto

Jun Miyazaki

A position measuring system includes: an image capturing unit that captures reference points provided on an object, the reference points composed of at least four first reference points provided respectively at vertices of a polygon or at vertices and a barycenter of a polygon and at least one second reference point provided so as to have a specific positional relationship with respect to the first reference points; an identification unit that identifies images of the first reference points and the second reference point captured by the image capturing unit, on the basis of positional relationships between the images of the first reference points and the second reference point; and a calculation unit that calculates a three-dimensional position and three-axial angles of the object on the basis of positional relationships of the images of the first reference points identified by the identification unit.

Position measuring system, position measuring method and computer readable medium

A longitudinal interference fringe pattern projection lens with a lens body is provided. The lens body includes a lens first surface that has two convex portions or two concave portions that extend in parallel to each other in a constant direction and have the same shape, and a lens second surface. Laser light passing through one convex or concave portion interferes with laser light passing through the other convex or concave portion to form a longitudinal interference fringe pattern.

Longitudinal interference fringe pattern projection lens, optical system, and three-dimensional image acquisition apparatus

A position measurement system for measuring positional coordinates of a point under measurement includes a first noise removal unit, a parameter determination unit and a second noise removal unit. The first noise removal unit removes noise from the measured positional coordinates to acquire first positional coordinate values. The parameter determination unit determines a noise removal parameter on a basis of the first positional coordinate values. The second noise removal unit again removes noise from the first positional coordinate values with using the noise removal parameter, to acquire second positional coordinate values.

Position measurement system

The position measurement system includes: an image capturing unit capturing first reference points which are three reference points on a plane arranged on a target and whose positional relation with each other is specified, and a second reference point which is a single reference point at a distance away from the plane and whose positional relation with the first reference points is specified; an identifying unit identifying images of the first and second reference points based on the positional relation among the images; and a calculating unit calculating a three-dimensional position and triaxial angles of the target based on the positional relation between the images of the first and second reference points. The calculating unit specifies the plane including the first reference points on the target from the images of the first reference points and a normal direction of the plane according to the image of the second reference point.

Position measurement system, position measurement method and computer readable medium

An optical lens system includes a lens surface capable of forming concentric interference patterns on an object as if light emitted from a single light source were virtually emitted from two or more light sources within a plane containing an optical axis of the single light source.

Optical lens system and position measurement system using the same

A position measurement system, includes: a plurality of concentric pattern projectors each for projecting a concentric pattern; an image sensor that has a sensor plane and that detects the concentric pattern; and an arithmetic unit that calculates a position of the image sensor and a normal direction of the sensor plane from a detection signal of the image sensor.

A positional measurement system includes an electromagnetic wave source which emits an electromagnetic wave, a lens system which has a first lens surface, an electromagnetic wave shield section provided around a center axis of the first lens surface, and a second lens surface, and causes the electromagnetic wave having entered by way of the first lens surface exclusive of the electromagnetic wave shield section to exit from the second lens surface, to form an electromagnetic wave concentrated area at a position opposite the electromagnetic wave source, a receiving device which detects the electromagnetic wave concentrated area formed by the lens system, and a computing device which measures a position of the electromagnetic wave source based on information detected by the receiving device on the electromagnetic wave concentrated area.

Positional measurement system and lens for positional measurement

A position measurement system includes a photographing unit and an arithmetic processing unit. The photographing unit has a lens and a light-receiving element. The lens forms an optical ring image from light from a light source through spherical aberration. The light-receiving element detects the optical ring image formed by the lens. The arithmetic processing unit measures a distance to the light source on the basis of the quantity of light of the optical ring image detected by the light-receiving element.

An information processing method using a terminal apparatus, including: applying light with a concentric ring-like interference fringe pattern on one of subjects by using a pointer provided in the terminal apparatus; detecting the interference fringe pattern by using a detector; calculating an optical axis of the pointer on the basis of a detection signal obtained from the detector; specifying attribute information of the subject on the basis of arrangement information of the subject intersected by the optical axis in the condition that arrangement information of the subjects and attribute information of the subjects are stored in a storage device in advance while the arrangement information of each subject and the attribute information of the subject are associated with each other; and displaying the attribute information of the specified subject on the terminal apparatus.

Information processing method and system using terminal apparatus

A position measuring system including a laser light source for radiating a laser beam, an optical lens system for generating an interference pattern on the basis of the laser beam having passed through different optical paths, a detector for detecting the interference pattern, and an arithmetic unit for calculating the position of at least one of the light source and the detector on the basis of a detection signal issued from the detector. For example, a spherical lens can be used as the optical lens system. In this case, the interference pattern is formed on the basis of spherical aberration of the lens. Alternatively, a multifocal lens may be used as the optical lens system.

Optical position measuring system using an interference pattern

A position measurement system optically measures a position of an object in a simple manner at low cost. The position measurement system includes: a light source; an optical lens with a large spherical aberration which transmits light from the light source and forms a light ring due to its spherical aberration; a light receiving device (CCD sensor) which detects the light ring as formed by the optical lens; and a calculator which measures a position of the light source according to detected information on the light ring as detected by the CCD sensor. An optical mirror with a large spherical aberration may be used instead of the optical lens.

Provided is a semiconductor device that has pseudo lattice matched layers with good crystallinity, formed with lattice mismatched materials. Tensile-strained n-type Al Ga N layers (lower side) and compressive-strained n-type Ga In N layers (upper side) are grown on a GaN crystal layer substrate in 16.5 periods to form an n-type DBR mirror; an undoped GaN spacer layer and an active region are grown on the n-type DBR mirror; and an undoped a GaN spacer layer is grown on the active region. Further, tensile-strained p-type Al Ga N layers (lower side) and compressive-strained p-type Ga In N layers (upper side) are grown on the spacer layer in 12 periods to form a p-type DBR mirror and eventually complete a surface emitting semiconductor laser.

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Kanagawa, Japan

Yasuji Seko