This inventor holds 1 USPTO granted patent and 1 published patent application and 1 EPO patent. Top assignee: Japan Science and Technology Agency. Active years: 2020.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2020
Title: Yasuhiro Mizutani: Innovator in Measurement and Irradiation Devices
Introduction
Yasuhiro Mizutani is a prominent inventor based in Osaka, Japan. He has made significant contributions to the field of measurement and irradiation devices. His innovative work has led to the development of a unique measurement device that enhances the accuracy and efficiency of spectral light analysis.
Latest Patents
Mizutani holds a patent for a measurement device and irradiation device. This device includes a light emitting part that emits a plurality of spectral lights, each containing two or more spectra distributed at different frequencies. The design allows for adjacent frequency intervals to differ from one another. The focusing part of the device is engineered to focus light by overlapping two or more spectra in various focal point regions of a sample. This results in a shift from each other, enabling precise measurements. Additionally, the detecting part acquires signals of fluorescence beats, which emit light through interference light beats in overlapping regions of the sample, providing valuable information about the sample.
Career Highlights
Mizutani is affiliated with the Japan Science and Technology Agency, where he continues to advance his research and development efforts. His work is characterized by a commitment to innovation and excellence in the field of optical measurement technologies.
Collaborations
Mizutani has collaborated with notable colleagues, including Takeshi Yasui and Tetsuo Iwata. These partnerships have fostered a collaborative environment that encourages the exchange of ideas and expertise.
Conclusion
Yasuhiro Mizutani's contributions to the field of measurement and irradiation devices exemplify the spirit of innovation. His patented technology not only enhances measurement accuracy but also opens new avenues for research and application in various scientific fields.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
