The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2020
Filed:
Aug. 09, 2018
Japan Science and Technology Agency, Saitama, JP;
Takeshi Yasui, Tokushima, JP;
Tetsuo Iwata, Tokushima, JP;
Yasuhiro Mizutani, Osaka, JP;
Takeo Minamikawa, Tokushima, JP;
Takahiko Mizuno, Tokushima, JP;
Eiji Hase, Tokushima, JP;
Hirotsugu Yamamoto, Utsunomiya, JP;
JAPAN SCIENCE AND TECHNOLOGY AGENCY, Saitama, JP;
Abstract
According to the present invention, a measurement device includes a light emitting part configured to emit a plurality of spectral lights each including two or more spectra distributed at mutually different frequencies by causing adjacent frequency intervals to be different from each other, a focusing part configured to focus light by causing two or more spectra to overlap in an overlapping region in each of a plurality of different focal point regions of a sample and to be shifted from each other, and a detecting part configured to acquire a signal of fluorescence beats which emits light by interference light beats in each of a plurality of overlapping regions in the sample and includes information of the sample.