Tokushima, Japan

Eiji Hase

This inventor holds 1 USPTO granted patent and 4 published patent applications and 1 EPO patent. Top assignee: Japan Science and Technology Agency. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Eiji Hase. Retrieved from https://idiyas.com/inventor/eiji-hase

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

 

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Eiji Hase: Innovator in Measurement and Irradiation Devices

Introduction

Eiji Hase is a notable inventor based in Tokushima, Japan. He has made significant contributions to the field of measurement and irradiation devices. His innovative work has led to the development of a unique patent that enhances the capabilities of measurement technology.

Latest Patents

Eiji Hase holds a patent for a measurement device and irradiation device. This invention includes a light emitting part that emits a plurality of spectral lights, each containing two or more spectra distributed at different frequencies. The device is designed to focus light by overlapping spectra in various focal point regions of a sample. Additionally, it features a detecting part that acquires signals of fluorescence beats, providing valuable information about the sample.

Career Highlights

Eiji Hase is associated with the Japan Science and Technology Agency, where he continues to advance his research and development efforts. His work is characterized by a commitment to innovation and excellence in the field of measurement technology.

Collaborations

Eiji Hase has collaborated with notable colleagues, including Takeshi Yasui and Tetsuo Iwata. These partnerships have contributed to the advancement of his research and the successful development of his patented technologies.

Conclusion

Eiji Hase is a distinguished inventor whose work in measurement and irradiation devices has made a significant impact in his field. His innovative patent reflects his dedication to advancing technology and improving measurement techniques.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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