Company Filing History:
Years Active: 2019
Title: Yasuhiro Kitada: Innovator in Substrate Defect Inspection Technology
Introduction
Yasuhiro Kitada is a prominent inventor based in Sapporo, Japan. He has made significant contributions to the field of substrate defect inspection technology. His innovative work has led to the development of a unique patent that enhances the efficiency and accuracy of defect detection in substrates.
Latest Patents
Yasuhiro Kitada holds a patent for a "Substrate defect inspection apparatus, method of adjusting sensitivity parameter value for substrate defect inspection, and non-transitory storage medium." This invention involves a method of adjusting a sensitivity parameter value for substrate defect inspection. It compares, for each pixel value of a selected virtual inspection substrate, the deviation amount from an allowable range corresponding to the position thereof. The method updates the deviation amount as a new sensitivity parameter value when certain conditions are met, thereby improving the inspection process.
Career Highlights
Yasuhiro Kitada is currently employed at Tokyo Electron Limited, a leading company in the semiconductor and electronics manufacturing industry. His work at the company has allowed him to focus on advancing technologies that are crucial for the production of high-quality electronic components.
Collaborations
Throughout his career, Yasuhiro has collaborated with notable colleagues, including Izumi Hasegawa and Hiroshi Tomita. These collaborations have fostered an environment of innovation and have contributed to the success of their projects.
Conclusion
Yasuhiro Kitada's contributions to substrate defect inspection technology exemplify the impact of innovative thinking in the field of electronics. His patent and work at Tokyo Electron Limited highlight his commitment to advancing technology and improving manufacturing processes.