This inventor holds 1 USPTO granted patent. Top assignees: Hitachi Chemical Company, Ltd., Yamada Den-on Co., Ltd.. Active years: 1996.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1996
Title: Yasuhiko Yokoya: Innovator in Semiconductor Measurement Technology
Introduction
Yasuhiko Yokoya is a notable inventor based in Shimodate, Japan. He has made significant contributions to the field of semiconductor technology, particularly through his innovative patent that enhances the measurement of semiconductor characteristics. His work has implications for various industries that rely on semiconductor technology.
Latest Patents
Yasuhiko Yokoya holds a patent for a "Jig for measuring the characteristics of a semiconductor." This invention features three main components: a first circuit board connected to a tester, a second circuit board linked to the semiconductor, and an intermediate board situated between the first and second circuit boards. The design allows for the first and second circuit boards to be electrically connected via springy pins. These pins, attached to the first circuit board, extend through the intermediate board to make contact with terminals on the second circuit board. This jig enables the measurement of various semiconductors by simply replacing the second circuit board, making it a versatile tool in semiconductor testing.
Career Highlights
Throughout his career, Yasuhiko Yokoya has worked with prominent companies, including Hitachi Chemical Company, Ltd. and Yamada Den-on Co., Ltd. His experience in these organizations has contributed to his expertise in semiconductor technology and innovation.
Collaborations
Yasuhiko has collaborated with notable colleagues such as Mitsuo Nakamura and Syuuichi Hasuda. These partnerships have likely fostered a creative environment that has led to advancements in their respective fields.
Conclusion
Yasuhiko Yokoya's contributions to semiconductor measurement technology exemplify the importance of innovation in the tech industry. His patent reflects a significant advancement that can streamline the testing process for semiconductors. His work continues to influence the field and inspire future innovations.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile