The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 24, 1996

Filed:

Mar. 06, 1995
Applicant:
Inventors:

Yasuhiko Yokoya, Shimodate, JP;

Noboru Yamazaki, Minoo, JP;

Mitsuo Nakamura, Osaka, JP;

Syuuichi Hasuda, Shimodate, JP;

Eisaku Namai, Shimodate, JP;

Syuuzou Yamada, Osaka, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324754 ; 324755 ;
Abstract

A jig for measuring the characteristics of various semiconductors has three main elements including a first circuit board to be connected to a tester for measuring the characteristics of the semiconductor, a second circuit board to be connected to the semiconductor and an intermediate board located between the first and second circuit boards. The first and second circuit boards are electrically connected together through springy pins. These pins, secured to the first circuit board, extend through the intermediate board via through holes to contact with terminals located in the second circuit board. When measuring the characteristics of various semiconductors it is possible to use the jig by replacing only the second circuit board with a board adapted to the particular semiconductor being measured without replacing the other elements of the jig.


Find Patent Forward Citations

Yokoya, Yasuhiko. (1996). Jig for measuring the characteristics of a semiconductor, manufacturing (U.S. Patent No. 5559443). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5559443

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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