Kanagawa, Japan

Yasuaki Homma

This inventor holds 1 USPTO granted patent. Top assignee: Adv Antest Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yasuaki Homma. Retrieved from https://idiyas.com/inventor/yasuaki-homma-bl82ndef

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Yasuaki Homma: Innovator in Test Methods and Panel Level Packaging

Introduction

Yasuaki Homma is a notable inventor based in Kanagawa, Japan. He has made significant contributions to the field of test methods and manufacturing processes, particularly in the area of panel level packaging. His innovative approach has led to the development of a unique patent that enhances the efficiency of testing electronic devices.

Latest Patents

Yasuaki Homma holds a patent for a "Test method, manufacturing method, panel level package, and test apparatus." This patent includes a comprehensive test method that involves placing a panel level package containing multiple unsingulated devices in a matrix on a placement unit. The method further details how to bring a series of contacts into contact with terminals of a test circuit, allowing for the testing of each device in the matrix efficiently.

Career Highlights

Homma is currently associated with Adv Antest Corporation, where he continues to innovate and develop new technologies. His work focuses on improving testing methods for electronic devices, which is crucial for ensuring quality and reliability in manufacturing.

Collaborations

Yasuaki Homma collaborates with Takeo Miura, a fellow innovator in the field. Their partnership has fostered advancements in testing technologies and methodologies.

Conclusion

Yasuaki Homma's contributions to the field of test methods and panel level packaging demonstrate his commitment to innovation and excellence. His patent reflects a significant advancement in the testing of electronic devices, showcasing his expertise and dedication to improving manufacturing processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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