Utrecht, Netherlands

Yaohua Mai

This inventor holds 2 USPTO granted patents. Top assignee: Forschungszentrum Julich Gmbh. Active years: 2012-2014.


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Location History:

  • Hebei, CN (2012)
  • Utrecht, NL (2014)

Company Filing History:


Years Active: 2012-2014

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2 patents (USPTO):Explore Patents

Title: The Innovations of Yaohua Mai

Introduction

Yaohua Mai is a notable inventor based in Utrecht, Netherlands. He has made significant contributions to the field of solar energy through his innovative work on thin-film solar cells. With a total of 2 patents, his inventions focus on enhancing the efficiency of solar technology.

Latest Patents

One of his latest patents is a method for producing a thin-film solar cell using microcrystalline silicon and a specific layer sequence. This invention discloses a thin-film solar cell that comprises several layers deposited on a substrate. The method involves applying a microcrystalline silicon layer to the lower p- or n-layer in pin or nip thin-layer solar cells using a Hot Wire Chemical Vapor Deposition (HWCVD) method. This innovative approach has been shown to increase the efficiency of the solar cell by up to 0.8% absolute.

Career Highlights

Yaohua Mai is currently associated with Forschungszentrum Jülich GmbH, where he continues to advance research in solar technology. His work has been instrumental in developing more efficient solar cells, contributing to the broader goal of sustainable energy solutions.

Collaborations

He has collaborated with notable colleagues such as Friedhelm Finger and Reinhard Carius, further enhancing the impact of his research through teamwork and shared expertise.

Conclusion

Yaohua Mai's contributions to the field of solar energy through his innovative patents demonstrate his commitment to advancing technology for a sustainable future. His work continues to inspire advancements in solar cell efficiency and renewable energy solutions.

Profile summary based on public USPTO records.
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