Yao-Wen Wu

Title: Innovator Spotlight: Yao-Wen Wu and His Automatic Statistical Process Control Patent

Introduction: Yao-Wen Wu, a notable inventor based in Tainan, Taiwan, has made a significant contribution to the field of process control with his innovative patent. His work primarily focuses on automatic statistical process control (SPC) chart generation, which enhances the efficiency and accuracy of monitoring complex processes.

Latest Patents: Yao-Wen Wu holds a patent for an "Automatic Statistical Process Control (SPC) Chart Generation Apparatus and Method Thereof." This innovative system comprises a storage device and a data acquisition module. The storage device is designed to store critical components such as a chamber management tree, recipe window management tree, parameter configuration table, and multiple chart profile records. The data acquisition module operates within memory, acquiring multiple process events and corresponding parameter values. It selects a relevant statistical algorithm to compute statistical values, creating a new chart profile record when necessary and accurately logging the statistical values along with measured time.

Career Highlights: Yao-Wen Wu is an esteemed member of the Taiwan Semiconductor Manufacturing Company Limited (TSMC), where he has leveraged his expertise to develop and refine techniques in semiconductor manufacturing. His role at TSMC has provided him with a platform to apply his innovative ideas in advanced technology, contributing significantly to the company’s success in the semiconductor sector.

Collaborations: Throughout his career, Yao-Wen Wu has collaborated with several talented individuals including his coworkers Mu-Tsang Lin and Tien-Wen Wang. Their joint efforts have fostered an environment of innovation and collaboration, enabling them to tackle complex challenges in the semiconductor industry effectively.

Conclusion: Yao-Wen Wu’s contributions in the realm of statistical process control represent a pivotal advance in manufacturing technology. His invention not only streamlines the process of generating SPC charts but also enhances the overall operational efficiency of semiconductor manufacturing. Wu's innovative spirit and collaborative approach demonstrate the power of combining expertise with cutting-edge technology in creating valuable solutions.