Shanghai, China

Yanzhong Ma

This inventor holds 1 USPTO granted patent. Top assignee: Advanced Micro-Fabrication Equipment Inc, Shanghai. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yanzhong Ma. Retrieved from https://idiyas.com/inventor/yanzhong-ma-sokcrols

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Yanzhong Ma: Innovator in Temperature Measurement Technology

Introduction

Yanzhong Ma is a notable inventor based in Shanghai, China. He has made significant contributions to the field of temperature measurement technology. His innovative approach has led to the development of a unique method for measuring the temperature of films in reaction chambers.

Latest Patents

Yanzhong Ma holds 1 patent for his invention titled "Method for measuring temperature of film in reaction chamber." This method involves obtaining reflectivity sampling data and thermal radiation value sampling data from a detection area of the film. By utilizing correction factors and blackbody radiation values, the method allows for accurate temperature measurement of the film.

Career Highlights

Yanzhong Ma is currently employed at Advanced Micro-Fabrication Equipment Inc. in Shanghai. His work focuses on advancing technologies that enhance the precision of temperature measurements in various applications. His expertise in this area has positioned him as a valuable asset to his company.

Collaborations

Yanzhong collaborates with talented coworkers, including Lu Chen and Chaoqian Zhang. Their combined efforts contribute to the innovative projects at Advanced Micro-Fabrication Equipment Inc.

Conclusion

Yanzhong Ma's contributions to temperature measurement technology exemplify the spirit of innovation. His patent reflects a commitment to advancing scientific understanding and practical applications in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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