Yanyan Xia

Title: Yanyan Xia: Innovator in Measurement Technology

Introduction

Yanyan Xia is a prominent inventor based in Shanghai, China. She has made significant contributions to the field of measurement technology, particularly in the detection of defects in solder joints. Her innovative approach has led to the development of a patented method that enhances the accuracy of measurement machines.

Latest Patents

Yanyan Xia holds a patent for a "Measurement machine and method for detecting a defect in solder joints." This invention focuses on an inspection method that trains a measurement machine to accurately measure side joint lengths and detect defects among multiple solder joints. The method involves receiving data from two measurement machines, determining a correlation value through statistical analysis, and updating the algorithm used by the first measurement machine to minimize deviations. This updated algorithm is then employed for dimensional metrology in detecting defects in solder joints.

Career Highlights

Yanyan Xia is currently employed at Hewlett Packard Enterprise Development LP, where she continues to innovate in the field of measurement technology. Her work has been instrumental in improving the reliability and efficiency of measurement processes in various applications.

Collaborations

Yanyan collaborates with notable colleagues, including Jaime E Llinas and Saravanan Rathakrishnan. These partnerships enhance her research and development efforts, contributing to advancements in measurement technology.

Conclusion

Yanyan Xia's contributions to measurement technology through her innovative patent demonstrate her expertise and commitment to improving industry standards. Her work continues to influence the field and pave the way for future advancements.