Rockville, MD, United States of America

Yantian Zhang

This inventor holds 1 USPTO granted patent. Top assignee: The Uab Reasearch Foundation. Active years: 2001.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yantian Zhang. Retrieved from https://idiyas.com/inventor/yantian-zhang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2001

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1 patent (USPTO):Explore Patents

Title: Yantian Zhang: Innovator in Magnetic Resonance Imaging

Introduction

Yantian Zhang is a notable inventor based in Rockville, MD (US). He has made significant contributions to the field of magnetic resonance imaging (MRI). His innovative work focuses on improving the efficiency of imaging techniques, which has important implications for medical diagnostics.

Latest Patents

Yantian Zhang holds a patent for a process titled "Process for rapid sample trajectory calibration for magnetic resonance imaging." This patent describes a k-space trajectory measurement method that has applications in magnetic resonance spectroscopy. The method involves comparing phase shift values associated with magnetic resonance signals from multiple sample regions to rapidly extract k-space trajectory measurements. This invention enhances the efficiency of image gradients, allowing them to be measured immediately before test imaging.

Career Highlights

Yantian Zhang is affiliated with the UAB Research Foundation, where he continues to develop and refine his innovative techniques in MRI. His work has garnered attention for its potential to streamline imaging processes and improve diagnostic accuracy.

Collaborations

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Conclusion

Yantian Zhang's contributions to magnetic resonance imaging exemplify the impact of innovation in medical technology. His patented methods are paving the way for advancements in imaging efficiency and accuracy.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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