The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2001
Filed:
May. 07, 1999
Applicant:
Inventor:
Yantian Zhang, Rockville, MD (US);
Assignee:
The UAB Reasearch Foundation, Birmingham, AL (US);
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 ;
U.S. Cl.
CPC ...
G01V 3/00 ;
Abstract
A k-space trajectory measurement method is disclosed with applications in magnetic resonance spectroscopy. Phase shift values associated with magnetic resonance signals from multiple sample regions are compared to rapidly extract k-space trajectory measurements. The efficiency of the present invention for image gradients to be measured immediately before test imaging.
Zhang, Yantian. (2001). Process for rapid sample trajectory calibration for magnetic resonance imaging (U.S. Patent No. 6239598). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6239598
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile