Company Filing History:
Years Active: 1999-2000
Title: Yann Malet: Innovator in Optical Metrology
Introduction
Yann Malet is a distinguished inventor based in Saint-Cyr l'Ecole, France. He has made significant contributions to the field of optical metrology, holding 2 patents that showcase his innovative approach to technology.
Latest Patents
One of his latest patents is the "Optical Ball Grid Array Inspection System." This invention involves a method and apparatus for inspecting three-dimensional structures, such as electronic components, using collimated light. The system accurately measures the three-dimensional structure of members protruding above the surface of the component. By illuminating the surface with collimated light, the spherical or other three-dimensional structures are analyzed using various techniques, including stereoscopic, holographic, Moire, or conoscopic analysis of light reflected or scattered by the structure, utilizing an array of optical detectors in a detector plane.
Another notable patent is the "Linear Conoscopic Holography." This invention features a linear conoscope that produces a conoscopic interferogram of an object. The phase shift that generates the interferogram is substantially linearly dependent on the displacement of the object from a geometrical axis. The design incorporates two anisotropic optical elements oriented to cancel the predominant term in which the phase shift depends quadratically on displacement from the geometrical axis.
Career Highlights
Yann Malet is currently associated with Optimet, Optical Metrology Ltd., where he continues to push the boundaries of optical measurement technologies. His work has been instrumental in advancing the capabilities of inspection systems in various applications.
Collaborations
Throughout his career, Yann has collaborated with notable colleagues, including Gabriel Y Sirat and Jacob Vecht. These partnerships have contributed to the development of innovative solutions in optical metrology.
Conclusion
Yann Malet's contributions to optical metrology through his patents and collaborations highlight his role as a key innovator in the field. His work continues to influence the industry and pave the way for future advancements in technology.