This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Kla Corporation. Active years: 2025.
Company Filing History:
Years Active: 2025
Title: Yaniv Weiss: Innovator in Overlay Metrology
Introduction
Yaniv Weiss is a prominent inventor based in Tel Aviv, Israel. He has made significant contributions to the field of overlay metrology, particularly through his innovative patent. His work focuses on enhancing measurement techniques that are crucial for various applications in technology and manufacturing.
Latest Patents
Yaniv Weiss holds a patent titled "Single grab pupil landscape via broadband illumination." This patent describes a method for overlay metrology that involves generating broadband illumination beams directed at an overlay target on a sample. The overlay target consists of cells with periodic features that form overlapping grating structures. The method utilizes these periodic features to generate diffracted light, which separates the broadband illumination beam into multiple wavelengths. Furthermore, it includes generating pupil images of the overlay target's cells, where the distribution of light in the pupil plane features first-order diffraction lobes. The overlay measurement is based on specific portions of the pupil images corresponding to selected wavelengths of the spectra of the first-order diffraction lobes. Yaniv Weiss has 1 patent to his name.
Career Highlights
Yaniv Weiss is associated with Kla Corporation, where he applies his expertise in overlay metrology. His work at the company has positioned him as a key player in advancing measurement technologies. His innovative approach has garnered attention in the industry, showcasing his commitment to improving metrology techniques.
Collaborations
Yaniv collaborates with Yuval Lubashevsky, contributing to the development of advanced measurement methods. Their partnership enhances the research and innovation efforts at Kla Corporation.
Conclusion
Yaniv Weiss is a notable inventor whose work in overlay metrology has led to significant advancements in measurement techniques. His contributions are vital for the ongoing evolution of technology in various industries.