Yan Guo

Title: Yan Guo - Innovator in Nondestructive Testing and Fatigue Damage Prognostics

Introduction

Yan Guo is a notable inventor based in Orlando, FL (US). He has made significant contributions to the field of nondestructive testing and fatigue damage prognostics. His innovative approach focuses on improving the accuracy of fatigue life predictions through advanced modeling techniques.

Latest Patents

Yan Guo holds a patent titled "Probabilistic modeling and sizing of embedded flaws in ultrasonic nondestructive inspections for fatigue damage prognostics and structural integrity assessment." This method enhances probabilistic fatigue life prediction by utilizing nondestructive testing data while accounting for uncertainties in nondestructive examination (NDE) data and fatigue model parameters. The methodology employs uncertainty quantification models for detection and sizing, along with a probability of detection model based on a log-linear relationship between actual flaw sizes and reported sizes from NDE. Additionally, it derives a distribution of actual flaw sizes using probabilistic modeling and Bayes theorem, demonstrated through a turbine rotor example with real-world NDE inspection data.

Career Highlights

Yan Guo is currently employed at Siemens Energy, Inc., where he applies his expertise in nondestructive testing and structural integrity assessment. His work is pivotal in enhancing the reliability and safety of engineering structures.

Collaborations

Yan collaborates with esteemed colleagues, including Waheed A Abbasi and Jingdan Zhang, who contribute to his research and development efforts in the field.

Conclusion

Yan Guo's innovative work in probabilistic modeling and nondestructive testing significantly advances the understanding of fatigue damage prognostics. His contributions are essential for improving structural integrity assessments in various engineering applications.