Yan Fen Liu

Title: Yan Fen Liu - Innovator in Abnormal Log Event Detection

Introduction

Yan Fen Liu is a notable inventor based in Tianjin, China. He has made significant contributions to the field of computer science, particularly in the area of log event detection and prediction. His innovative work has led to the development of a patented method that enhances the ability to identify and predict abnormal log events.

Latest Patents

Yan Fen Liu holds a patent for "Abnormal log event detection and prediction." This patent describes a computer-implemented method, computer system, and computer program product designed to detect and predict abnormal log events. The method involves determining a current event cluster from multiple event clusters for a log line in a log file. Among these clusters, at least one is identified as an abnormal event cluster. The method further predicts the time of event transition from the current event cluster to the abnormal event cluster.

Career Highlights

Yan Fen Liu is currently employed at International Business Machines Corporation, commonly known as IBM. His work at IBM has allowed him to apply his innovative ideas in a practical setting, contributing to advancements in technology and software development.

Collaborations

Yan Fen Liu has collaborated with several talented individuals in his field, including Yi Ming Wang and Hui Dong. These collaborations have fostered a creative environment that encourages the exchange of ideas and the development of cutting-edge solutions.

Conclusion

In summary, Yan Fen Liu is a distinguished inventor whose work in abnormal log event detection has made a significant impact in the field of computer science. His contributions continue to influence advancements in technology and software solutions.