The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 02, 2025

Filed:

Jun. 30, 2021
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Yi Ming Wang, Xian, CN;

Hui Dong, Xian, CN;

Zhong Fang Yuan, Xian, CN;

Tong Liu, Xian, CN;

Yan Fen Liu, Tianjin, CN;

Ling Chen, Beijing, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 18/23213 (2023.01); G06F 16/18 (2019.01); G06F 16/9032 (2019.01); G06F 16/906 (2019.01); G06F 18/214 (2023.01);
U.S. Cl.
CPC ...
G06F 18/23213 (2023.01); G06F 16/1805 (2019.01); G06F 16/90332 (2019.01); G06F 16/906 (2019.01); G06F 18/214 (2023.01);
Abstract

The embodiments of the present disclosure disclose a computer-implemented method, computer system and a computer program product for detecting and predicting an abnormal log event. In the method, a current event cluster from a plurality of event clusters for a log line in a log file is determined. The plurality of event clusters include at least one abnormal event cluster. Then, a time of event transition from the current event cluster to at least one abnormal event cluster is predicted.


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