TOKYO, Japan

Yamato Okamoto

This inventor holds 3 USPTO granted patents and 5 published patent applications and 3 EPO patents. Top assignee: Omron Corporation. Active years: 2025-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yamato Okamoto. Retrieved from https://idiyas.com/inventor/yamato-okamoto

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 3 

% Patents Active = 100.0

 

Average Co-Inventor Count = 2.3

ph-index = 1


Company Filing History:


Years Active: 2025-2026

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3 patents (USPTO):Explore Patents

Title: Yamato Okamoto: Innovator in Model Generation Technology

Introduction

Yamato Okamoto is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of model generation technology. His innovative work focuses on improving defect detection and feature identification through advanced estimation techniques.

Latest Patents

Yamato Okamoto holds 1 patent for a model generation apparatus, estimation apparatus, model generation method, and a computer-readable storage medium. This patent includes a unique approach to training a model by deliberately reducing estimation performance to enhance defect detection and feature identification. The model generation apparatus executes operations with respect to each learning data set, including training a second estimator and a coder alternately and repeatedly.

Career Highlights

Yamato Okamoto is currently employed at Omron Corporation, where he applies his expertise in model generation technology. His work has been instrumental in advancing the capabilities of estimation apparatuses in various applications.

Collaborations

Yamato collaborates with talented coworkers, including Ryo Yonetani and Atsushi Hashimoto. Their combined efforts contribute to the innovative projects at Omron Corporation.

Conclusion

Yamato Okamoto is a key figure in the field of model generation technology, with a focus on enhancing defect detection and feature identification. His contributions through patents and collaboration with colleagues continue to drive innovation in this area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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