Omron Corporation

Yamato Okamoto

Atsushi Hashimoto

Ryo Yonetani

Yoshiaki Miyata

Masahiro Nakata

A model generation apparatus according to one or more embodiments executes operations, with respect to each of learning data sets. The operations includes training a second estimator so that an estimation result obtained from a second estimator conforms to second correct answer data; training a coder so that an estimation result obtained from the second estimator does not conform to the second correct answer data; and training the coder and the first estimator so that an estimation result obtained from a first estimator conforms to first correct answer data. The model generation apparatus executes operation of the training the second estimator and the training the coder alternately and repeatedly.

Model generation apparatus, estimation apparatus, model generation method, and computer-readable storage medium storing a model generation program including training a model by converting training data to deliberately reduce estimation performance for improved defect detection and feature identification

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TOKYO, Japan

Yamato Okamoto