Company Filing History:
Years Active: 2005-2013
Title: Yalin Lu: Innovator in Scanning Evanescent Microwave Microscopy
Introduction
Yalin Lu is a prominent inventor based in Chelmsford, MA (US). He has made significant contributions to the field of microscopy, particularly through his innovative work on scanning evanescent microwave microscopes. With a total of 3 patents, his inventions have advanced the capabilities of imaging and measuring electrical properties of materials.
Latest Patents
One of Yalin Lu's latest patents is the Analytical Scanning Evanescent Microwave Microscope and Control Stage. This invention utilizes near-field evanescent electromagnetic waves to probe sample properties. The scanning evanescent microwave microscope (SEMM) is capable of high-resolution imaging and quantitative measurements of the electrical properties of samples. It can map dielectric constant, loss tangent, conductivity, electrical impedance, and other electrical parameters of materials. The SEMM provides distance control over a wide range, from microns to nanometers, enabling quantitative non-contact and submicron spatial resolution topographic and electrical impedance profiling of dielectric, nonlinear dielectric, and conductive materials. Additionally, the invention allows for the quantitative estimation of microwave impedance using signals obtained by the scanned evanescent microwave probe and quasistatic approximation modeling. The SEMM can effectively measure electrical properties of both dielectric and electrically conducting materials.
Career Highlights
Yalin Lu has worked with notable organizations, including the University of California and Corning Incorporated. His experience in these institutions has contributed to his expertise in the field of microscopy and materials science.
Collaborations
Throughout his career, Yalin Lu has collaborated with esteemed colleagues such as Xiao-dong Xiang and Chen Gao. These partnerships have further enriched his research and development efforts.
Conclusion
Yalin Lu's innovative work in scanning evanescent microwave microscopy has significantly impacted the field of materials science. His contributions continue to pave the way for advancements in high-resolution imaging and electrical property measurements.
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