University of California

Corning Incorporated

Yalin Lu

Xiao-dong Xiang

Chen Gao

Fred Duewer

Hai Tao Yang

Kewen Kevin Li

Qingwu Wang

A scanning evanescent microwave microscope (SEMM) that uses near-field evanescent electromagnetic waves to probe sample properties is disclosed. The SEMM is capable of high resolution imaging and quantitative measurements of the electrical properties of the sample. The SEMM has the ability to map dielectric constant, loss tangent, conductivity, electrical impedance, and other electrical parameters of materials. Such properties are then used to provide distance control over a wide range, from to microns to nanometers, over dielectric and conductive samples for a scanned evanescent microwave probe, which enable quantitative non-contact and submicron spatial resolution topographic and electrical impedance profiling of dielectric, nonlinear dielectric and conductive materials. The invention also allows quantitative estimation of microwave impedance using signals obtained by the scanned evanescent microwave probe and quasistatic approximation modeling. The SEMM can be used to measure electrical properties of both dielectric and electrically conducting materials.

Analytical scanning evanescent microwave microscope and control stage

The present invention provides an electro-optic ceramic material including lead, magnesium, niobium and titanium having a propagation loss of less than about 3 dB/cm and a quadratic electro-optic coefficient of greater than about 2&#xd7;10m/Vat 20&#xb0; C. at a wavelength of 1550 nm. The present invention also provides electro-optic devices including an electro-optic ceramic material including lead, magnesium, niobium and titanium having a propagation loss of less than about 3 dB/cm and a quadratic electro-optic coefficient of greater than about 2&#xd7;10m/Vat 20&#xb0; C. at a wavelength of 1550 nm. The materials and devices of the present invention are useful in optical communications applications such as intensity and phase modulation, switching, and polarization control.

Electro-optic ceramic material and device

Growing community of inventors

Chelmsford, MA, United States of America

Yalin Lu