Company Filing History:
Years Active: 2019
Title: Yair Carmon: Innovator in Defect Detection Technologies
Introduction
Yair Carmon is a notable inventor based in Stanford, California, recognized for his contributions to defect detection technologies. With a total of two patents to his name, he has made significant advancements in methods and systems for identifying defects in various patterns.
Latest Patents
Carmon’s latest patents include innovative systems designed for defect detection. The first patent, titled "Contour Based Defect Detection," outlines methods and systems for detecting defects in patterns formed on a specimen. This system utilizes one or more components executed by computer subsystems, which include first and second learning-based models. The first model generates simulated contours for patterns based on a design for the specimen, while the second model generates actual contours from acquired images. The system compares these contours to detect defects effectively.
The second patent, "Single Image Detection," presents methods and systems for detecting defects on a specimen using a generative model. This model employs a non-linear network to map blocks of pixels from an input feature map volume into labels that indicate defect-related characteristics. By inputting a single test image, the system determines features and detects defects based on the generated labels.
Career Highlights
Yair Carmon is currently associated with KLA-Tencor Corporation, where he applies his expertise in developing advanced defect detection technologies. His work has contributed to enhancing the reliability and efficiency of various manufacturing processes.
Collaborations
Carmon has collaborated with notable colleagues, including Sankar Venkataraman and Laurent Karsenti, to further advance the field of defect detection.
Conclusion
Yair Carmon stands out as an influential inventor in the realm of defect detection technologies. His innovative patents and contributions to KLA-Tencor Corporation highlight his commitment to advancing this critical area of technology.