Xiamen, China

Ya Xuan Zhuang

This inventor holds 1 USPTO granted patent. Top assignee: United Semiconductor (Xiamen) Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ya Xuan Zhuang. Retrieved from https://idiyas.com/inventor/ya-xuan-zhuang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: The Innovations of Ya Xuan Zhuang

Introduction

Ya Xuan Zhuang is a notable inventor based in Xiamen, China. He has made significant contributions to the field of semiconductor technology. His work focuses on enhancing the efficiency and effectiveness of semiconductor testing methods.

Latest Patents

Ya Xuan Zhuang holds a patent for a "Semiconductor test key structure and test method of semiconductor structure." This invention provides a semiconductor test key structure that includes a substrate, multiple gate structures located on the substrate, and several thin film resistor layers. Each thin film resistor layer is positioned above one of the gate structures and is situated within a dielectric layer. Additionally, a test key circuit layer is placed on the dielectric layer, designed in a square wave pattern from a top view, with two contact pads connected to the test key circuit layer. This innovative approach aims to improve the testing process for semiconductor structures.

Career Highlights

Ya Xuan Zhuang is currently employed at United Semiconductor (Xiamen) Co., Ltd. His role at the company allows him to apply his expertise in semiconductor technology and contribute to the development of advanced testing methods.

Collaborations

Some of his coworkers include Wei-Chun Chang and You-Di Jhang, who collaborate with him on various projects within the semiconductor field.

Conclusion

Ya Xuan Zhuang's contributions to semiconductor technology through his innovative patent demonstrate his commitment to advancing the industry. His work continues to influence the efficiency of semiconductor testing methods.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…