Ya-Chung Chan

Title: Innovations of Ya-Chung Chan in Hotspot Detection Technology

Introduction

Ya-Chung Chan is a notable inventor based in Miaoli County, Taiwan. He has made significant contributions to the field of semiconductor technology, particularly in the area of process hotspot detection. His innovative techniques have the potential to enhance the efficiency and accuracy of design rule checks in electronic layouts.

Latest Patents

Ya-Chung Chan holds a patent for an "Accurate process hotspot detection using critical design rule extraction." This patent presents a technique that utilizes critical design rule (DRC) extraction to accurately detect process hotspots. The method involves generating horizontal and vertical tiles from a pattern and adding directed edges to indicate relationships between adjacent tiles. Additionally, rule rectangles are created to describe polygon placement with a minimal number of critical DRC rules. The extracted DRC rules can be incorporated into a DRC runset file, allowing for effective DRC execution on layouts. The results can then be filtered using the rule rectangles to identify and verify potential hotspots.

Career Highlights

Ya-Chung Chan is currently employed at Synopsys, Inc., a leading company in electronic design automation. His work at Synopsys has allowed him to apply his innovative ideas in a practical setting, contributing to advancements in the semiconductor industry.

Collaborations

Ya-Chung Chan has collaborated with notable colleagues, including Charles C Chiang and Yen-Ting Yu, who is a talented woman in the field. These collaborations have fostered a creative environment that encourages the development of cutting-edge technologies.

Conclusion

Ya-Chung Chan's contributions to the field of hotspot detection technology exemplify the impact of innovative thinking in the semiconductor industry. His patent and collaborative efforts highlight the importance of teamwork in driving technological advancements.