Company Filing History:
Years Active: 2026
Title: Xuzhao Liu: Innovator in Optical Wafer Characterization
Introduction
Xuzhao Liu is a notable inventor based in Milpitas, CA (US). He has made significant contributions to the field of optical wafer characterization. His innovative work has led to the development of a patented system that enhances the detection of wafer defects.
Latest Patents
Xuzhao Liu holds a patent for a "System and method for optical wafer characterization with image up-sampling." This system includes a processing unit that is communicatively coupled to a detector array of an optical wafer characterization system. The processing unit is designed to perform several steps, including acquiring target images from the detector array, applying a de-noising filter, determining difference images from reference and target images, and up-sampling these difference images. This process allows for the detection of wafer defects in the resulting images. He has 1 patent to his name.
Career Highlights
Xuzhao Liu is currently employed at Kla Corporation, where he continues to work on advancements in optical technologies. His expertise in this area has positioned him as a valuable asset to his team and the company.
Collaborations
Xuzhao Liu collaborates with talented individuals such as Abdurrahman Sezginer and Wei Zhao. Their combined efforts contribute to the innovative projects at Kla Corporation.
Conclusion
Xuzhao Liu's work in optical wafer characterization exemplifies the impact of innovation in technology. His patented system not only enhances defect detection but also showcases his commitment to advancing the field.