Xi'an, China

Xurong Qiao

This inventor holds 1 USPTO granted patent. Top assignee: Xi'an Jiaotong University. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Xurong Qiao. Retrieved from https://idiyas.com/inventor/xurong-qiao

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Xurong Qiao: Innovator in Rare Earth Nickelate Thin Films

Introduction

Xurong Qiao is a prominent inventor based in Xi'an, China. He has made significant contributions to the field of magnetron sputtering processes, particularly in the development of methods to enhance the uniformity of rare earth nickelate thin films.

Latest Patents

Xurong Qiao holds a patent titled "Method for improving the uniformity of rare earth nickelate thin films deposited by reactive magnetron sputtering." This invention addresses the challenges associated with the introduction of reactive gas in traditional magnetron sputtering processes, which often compromises the uniformity of the resulting thin films. The method involves adjusting the sputter angle of a nickel target to optimize the deposition process, thereby achieving a zero-gradient deposition of nickel and rare earth elements on the substrate surface.

Career Highlights

Xurong Qiao is affiliated with Xi'an Jiaotong University, where he continues to advance research in thin film technology. His work has garnered attention for its innovative approach to improving material properties through precise engineering techniques.

Collaborations

He has collaborated with notable colleagues, including Zhen Zhang and Jiahui Sun, to further explore advancements in the field of magnetron sputtering and thin film applications.

Conclusion

Xurong Qiao's contributions to the field of rare earth nickelate thin films exemplify the importance of innovation in material science. His patented methods not only enhance the quality of thin films but also pave the way for future advancements in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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