Edinburgh, United Kingdom

Xueli Liu

This inventor holds 1 USPTO granted patent. Top assignee: Future Wei Technologies, Inc.. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Xueli Liu. Retrieved from https://idiyas.com/inventor/xueli-liu-8fqfy3qs

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Xueli Liu: Innovator in Graph Functional Dependency Checking

Introduction

Xueli Liu is a notable inventor based in Edinburgh, GB. He has made significant contributions to the field of data error detection through his innovative patent. His work focuses on enhancing the reliability of data management systems.

Latest Patents

Xueli Liu holds a patent titled "Graph Functional Dependency Checking." This invention presents a computer-implemented method for detecting errors in data. The method involves obtaining one or more graph functional dependency (GFD) rules, acquiring a set of GFDs representative of the data, building a canonical graph for the GFD rules, and determining conflicts among the GFDs based on the established rules and graph. This process ultimately leads to the identification of errors within the data set.

Career Highlights

Xueli Liu is currently employed at Future Wei Technologies, Inc. His role at the company allows him to apply his expertise in data management and error detection. His innovative approach has positioned him as a valuable asset in the tech industry.

Collaborations

Xueli Liu has collaborated with notable colleagues, including Yu Cheng Chen and Wenfei Fan. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

Xueli Liu's contributions to the field of data error detection through his patent on graph functional dependency checking exemplify his commitment to innovation. His work continues to influence the way data integrity is maintained in various applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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