The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 03, 2021

Filed:

Jul. 30, 2018
Applicant:

Futurewei Technologies, Inc., Plano, TX (US);

Inventors:

Wenfei Fan, Edinburgh, GB;

Xueli Liu, Edinburgh, GB;

Yu Chen, San Jose, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/23 (2019.01); G06F 16/901 (2019.01);
U.S. Cl.
CPC ...
G06F 16/2365 (2019.01); G06F 16/9024 (2019.01);
Abstract

A computer implemented method for detecting errors in data includes obtaining one or more graph functional dependency (GFD) rules comprising a set of GFD rules, obtaining a set of GFDs representative of the data, building a canonical graph for the GFD rules, and determining that one or more GFD of the set of GFDs conflict based on the set of GFD rules and the canonical graph and, based thereon, determining an error in the set of GFDs.


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