Fremont, CA, United States of America

Xuan Wang

This inventor holds 1 USPTO granted patent. Top assignee: Kla Corporation. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Xuan Wang. Retrieved from https://idiyas.com/inventor/xuan-wang-djg8s2nv

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Xuan Wang: Innovator in Imaging Systems

Introduction

Xuan Wang is a talented inventor based in Fremont, CA (US). She has made significant contributions to the field of imaging systems, particularly through her innovative patent. Her work focuses on enhancing inspection systems, which are crucial in various industries.

Latest Patents

Xuan Wang holds a patent for "Scanning differential interference contrast in an imaging system design." This inspection system includes an illumination source, a TDI-CCD sensor, and a dark field/bright field sensor. A polarizer receives the light from the light source, which is then directed at a Wollaston prism, often through a half wave plate. The combination of the TDI-CCD sensor and the dark field/bright field sensor provides high spatial resolution, high defect detection sensitivity, and an excellent signal-to-noise ratio, along with fast inspection speed. She has 1 patent to her name.

Career Highlights

Xuan Wang is currently employed at Kla Corporation, where she continues to develop and refine her innovative ideas. Her work at Kla Corporation has positioned her as a key player in the advancement of imaging technology.

Collaborations

Xuan collaborates with talented coworkers, including Andrew Zeng and Steve Xu. Their combined expertise fosters a creative environment that drives innovation in their projects.

Conclusion

Xuan Wang is a remarkable inventor whose contributions to imaging systems are noteworthy. Her patent reflects her dedication to improving inspection technologies, and her work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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