Xintian Bian

Title: Xintian Bian: Innovator in Optical Film Detection

Introduction

Xintian Bian is a prominent inventor based in Huaian, China. He has made significant contributions to the field of optical technology, particularly in the detection of optical film defects. With a total of 2 patents to his name, Bian's work showcases his innovative approach to solving complex problems in optical measurement.

Latest Patents

Bian's latest patents include a "Differential interference-based optical film defect detection method" and an "Asymmetric optical interference measurement method and apparatus." The first patent outlines a method for detecting optical film defects using differential interference. This method involves adjusting incident light into a planar wave and analyzing the resulting differential interference image to identify both superficial and internal defects in the optical film. The second patent describes an asymmetric optical interferometry method that splits incident light into two beams, projecting them onto an object and a reference mirror. This technique allows for the creation of interference images that can be analyzed to obtain a three-dimensional shape of the object's surface.

Career Highlights

Xintian Bian is affiliated with Huaiyin Normal University, where he continues to advance research in optical technologies. His academic background and innovative spirit have positioned him as a key figure in his field.

Collaborations

Bian collaborates with Feng Lei, contributing to the development of new methodologies and technologies in optical measurement.

Conclusion

Xintian Bian's contributions to optical technology through his patents reflect his dedication to innovation and problem-solving. His work not only enhances the understanding of optical film defects but also paves the way for future advancements in the field.