The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 27, 2021
Filed:
May. 27, 2017
Huaiyin Normal University, Jiangsu, CN;
Feng Lei, Huaian, CN;
Xintian Bian, Huaian, CN;
HUAIYIN NORMAL UNIVERSITY, Huaian, CN;
Abstract
An asymmetric optical interferometry method, comprises the following steps: an incident light is split into two beams, and the two beams are respectively projected onto a surface of an object to be tested and a reference mirror; and then respectively pass through a first imaging lens having a larger area on the side of the object, and a second imaging lens having a smaller area on the side of the reference mirror, and overlap on a photoelectric sensor after passing through a third imaging lens to form at least one interference image (S); the corresponding interference image is input into a computer to obtain a signal of the corresponding interference image (S); parse the signal of the corresponding interference image to obtain a three-dimensional shape (S) of the surface of the object. Also provide an asymmetric optical interferometry device.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile