Feng Lei

Title: Innovations of Feng Lei in Optical Film Detection

Introduction

Feng Lei is a notable inventor based in Huaian, China. He has made significant contributions to the field of optical film detection, holding a total of 2 patents. His work focuses on advanced methods for detecting defects in optical films, showcasing his expertise and innovative spirit.

Latest Patents

Feng Lei's latest patents include a "Differential interference-based optical film defect detection method." This method involves adjusting incident light into a planar light wave, which then interacts with the surface of an optical film to detect both superficial and internal defects. The process utilizes differential interference to form images that are analyzed for defects.

Another significant patent is the "Asymmetric optical interference measurement method and apparatus." This method splits incident light into two beams, projecting them onto an object and a reference mirror. The resulting interference images are processed to obtain a three-dimensional shape of the object's surface, demonstrating Feng Lei's innovative approach to optical measurements.

Career Highlights

Feng Lei is affiliated with Huaiyin Normal University, where he continues to advance research in optical technologies. His academic background and ongoing research contribute to the development of new methodologies in the field.

Collaborations

Feng Lei collaborates with Xintian Bian, enhancing the research output and innovation potential in their projects. Their partnership exemplifies the importance of teamwork in advancing technological frontiers.

Conclusion

Feng Lei's contributions to optical film detection through his innovative patents highlight his role as a leading inventor in this field. His work not only advances technology but also sets a foundation for future research and development in optical measurements.