Xi'an, China

Xinmiao Zhou

This inventor holds 1 USPTO granted patent. Top assignee: Xi'an Jiaotong University. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Xinmiao Zhou. Retrieved from https://idiyas.com/inventor/xinmiao-zhou

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 8.0

ph-index = 1


Company Filing History:


Years Active: 2025

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Innovations of Xinmiao Zhou in Optical Measurement Technology.

Introduction

Xinmiao Zhou is a notable inventor based in Xi'an, China. He has made significant contributions to the field of optical measurement technology. His work focuses on developing advanced devices and methods for measuring plasma magnetic fields.

Latest Patents

Xinmiao Zhou holds a patent for an "Optical measuring device and method for plasma magnetic field with adjustable sensitivity." This innovative patent discloses a method that involves constructing an optical rotation measurement system based on a pulsed laser beam. The system is designed to measure both an optical rotation image and a shadow image. The process includes obtaining a distribution of proportional coefficients based on light intensity distribution and calculating a distribution of electron areal densities based on the phase shift in the interference image.

Career Highlights

Xinmiao Zhou is affiliated with Xi'an Jiaotong University, where he continues to advance his research in optical measurement technologies. His work has garnered attention for its potential applications in various scientific fields.

Collaborations

Xinmiao Zhou collaborates with esteemed colleagues, including Jian Wu and Zhiyuan Jiang. Their combined expertise enhances the research and development of innovative measurement technologies.

Conclusion

Xinmiao Zhou's contributions to optical measurement technology demonstrate his commitment to advancing scientific understanding and innovation. His patent reflects a significant step forward in measuring plasma magnetic fields with adjustable sensitivity.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…