Xingwen Li

Title: Innovations and Contributions of Inventor Xingwen Li

Introduction

Xingwen Li is a prominent inventor based in Xi'an, China. He has made significant contributions to the field of optical measurement and diagnostics, holding a total of 5 patents. His work focuses on advanced technologies that enhance measurement accuracy and optimize diagnostic processes.

Latest Patents

One of his latest patents is an "Optical measuring device and method for plasma magnetic field with adjustable sensitivity." This invention involves constructing an optical rotation measurement system based on a pulsed laser beam. The method includes processing optical rotation images and shadow images to obtain a distribution of proportional coefficients and rotation angles. Additionally, it constructs an interference measurement system to measure phase shifts and calculate electron areal densities, ultimately providing a two-dimensional distribution of the average magnetic field.

Another notable patent is the "Stress and shock wave diagnosis fused LIBS optimization system and method." This system collects shock wave signals, stress wave signals, and spectral signals from objects subjected to pulsed laser ablation. It processes these signals to obtain intensities and adjusts optimization variables for enhanced measurement and diagnosis. This innovative approach improves the scientificity and persuasiveness of optimization results.

Career Highlights

Xingwen Li has worked at prestigious institutions, including Xi'an Jiaotong University and Suzhou Nuclear Power Research Institute Co., Ltd. His experience in these organizations has allowed him to develop and refine his innovative ideas, contributing to advancements in his field.

Collaborations

Throughout his career, Xingwen Li has collaborated with notable colleagues such as Jian Wu and Zhi Zhang. These partnerships have fostered a collaborative environment that encourages the exchange of ideas and enhances the quality of research and development.

Conclusion

Xingwen Li's contributions to optical measurement and diagnostics demonstrate his innovative spirit and commitment to advancing technology. His patents reflect a deep understanding of complex systems and a dedication to improving measurement accuracy. His work continues to influence the field and inspire future innovations.