Shenzhen, China

Xingbo Wang

This inventor holds 2 USPTO granted patents. Top assignees: Aac Optics Solutions Pte. Ltd., Southern University of Science and Technology. Active years: 2020-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Xingbo Wang. Retrieved from https://idiyas.com/inventor/xingbo-wang-s2vyar99

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2020-2026

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2 patents (USPTO):Explore Patents

Title: Innovations of Xingbo Wang

Introduction

Xingbo Wang is a notable inventor based in Shenzhen, China. He has made significant contributions to the field of image processing and measurement technologies. With a total of 2 patents, his work reflects a commitment to advancing technological capabilities.

Latest Patents

Wang's latest patents include an image feature extraction method and apparatus, as well as a device and method for measuring spatial color and resolution. The image feature extraction method utilizes a convolutional neural network to optimize the processing of images. By employing the Karatsuba algorithm, it effectively reduces resource consumption during convolution operations, leading to efficient output feature maps. The device for measuring spatial color and resolution allows for simultaneous assessment of camera characteristics, thereby shortening manufacturing cycles and reducing costs.

Career Highlights

Throughout his career, Wang has worked with various organizations, including Aac Optics Solutions and Southern University of Science and Technology. His experience in these institutions has contributed to his expertise in optics and image processing technologies.

Collaborations

Wang has collaborated with professionals such as Ville Nummela and Ossi Pirinen, enhancing his projects through shared knowledge and expertise.

Conclusion

Xingbo Wang's innovative contributions to image processing and measurement technologies demonstrate his significant impact in the field. His patents reflect a dedication to improving efficiency and reducing costs in technological applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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