The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2020
Filed:
Nov. 21, 2018
Aac Technologies Pte. Ltd., Singapore, SG;
Ossi Pirinen, Shenzhen, CN;
Tuomas Punta, Shenzhen, CN;
Ville Nummela, Shenzhen, CN;
Xingbo Wang, Shenzhen, CN;
AAC Optics Solutions Pte. Ltd., Singapore, SG;
Abstract
A device and a method for measuring spatial color characteristic and resolution are provided. The measuring device includes: a light source, a measuring dial plate and a camera under test, wherein the light source has at least two different spectral power distribution characteristics, the measuring dial plate is provided with a through hole penetrating a thickness direction of the measuring dial plate, the light emitted from the light source passes through the through hole, and the surface of the measuring dial plate is set in black color; the measuring dial plate can also be provided with a measuring pattern, the light emitted from the light source passes through a region other than the measuring pattern. With the device provided in the present disclosure, the spatial color and resolution of the camera can be measured simultaneously, which shortens the manufacture cycle of the camera and reduces measurement cost.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile