Xing Wang

Title: Innovations of Xing Wang in Photonic Resonator Interferometric Scattering Microscopy

Introduction

Xing Wang is a notable inventor based in Champaign, Illinois. He has made significant contributions to the field of microscopy through his innovative work on photonic resonator interferometric scattering microscopy. His research focuses on enhancing imaging techniques using advanced photonic crystal technology.

Latest Patents

Xing Wang holds a patent for his invention titled "Photonic Resonator Interferometric Scattering Microscopy." This patent discloses methods and systems that utilize a photonic crystal for interference scattering microscopy. The invention involves directing incident light onto the surface of the photonic crystal, which couples into a photonic crystal guided resonance mode. Remarkably, less than 1% of the incident light is transmitted through the photonic crystal. Particles adjacent to the surface scatter a portion of the coupled light, creating an image that captures a pattern of constructive and destructive interference. This innovative approach allows for the identification of scattering centers corresponding to particles, enhancing the capabilities of imaging processing.

Career Highlights

Xing Wang is affiliated with the University of Illinois, where he continues to advance his research in photonic technologies. His work has garnered attention for its potential applications in various scientific fields, particularly in improving imaging techniques.

Collaborations

Xing Wang has collaborated with esteemed colleagues, including Brian T Cunningham and Nantao Li. Their combined expertise contributes to the advancement of research in photonic applications and microscopy.

Conclusion

Xing Wang's contributions to photonic resonator interferometric scattering microscopy represent a significant advancement in imaging technology. His innovative methods and systems have the potential to revolutionize how we capture and analyze microscopic images.