The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2025
Filed:
Feb. 03, 2022
The Board of Trustees of the University of Illinois, Urbana, IL (US);
Brian T. Cunningham, Champaign, IL (US);
Nantao Li, Champaign, IL (US);
Taylor D. Canady, Champaign, IL (US);
Qinglan Huang, Santa Clara, CA (US);
Xing Wang, Champaign, IL (US);
THE BOARD OF TRUSTEES OF THE UNIVERSITY OF ILLINOIS, Urbana, IL (US);
Abstract
Disclosed herein are methods and systems that use a photonic crystal (PC) for interference scattering microscopy. Incident light is directed onto a surface of the PC and couples into a photonic crystal guided resonance (PCGR) mode of the PC such that less than 1% of the incident light is transmitted through the PC as transmitted light. One or more particles adjacent to the surface of the PC scatter a portion of the light coupled into the PCGR mode as scattered light. An image comprising a pattern of constructive and destructive interference between the transmitted light and the scattered light is formed, and an image sensor may capture one or more image frames of the image. Imaging processing of the one or more image frames can be used to identify at least one scattering center corresponding to at least one particle of the one or more particles.