Qujing, China

Xin Ye

This inventor holds 1 USPTO granted patent. Top assignee: University of Electronic Science and Technology of China. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Xin Ye. Retrieved from https://idiyas.com/inventor/xin-ye-td2jj247

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Xin Ye and Neural-Network-Based Fringe Analysis

Introduction

Xin Ye is an inventor associated with the University of Electronic Science and Technology of China in Qujing, China. His work includes a patent for detecting fringe lines and unwrapping phase information with a convolutional neural network.

Latest Patents

The provided information lists one patent for Xin Ye: “Fringe Line Detection and Phase Unwrapping Method and System Based on FL-Net Convolutional Neural Network.” The method uses an FL-Net network to detect fringe lines in an input image, repairs detected lines through circulation integral, and unwraps them through path integral. It then uses the network to identify and process error points. The described approach replaces down-sampling with an HDC method to avoid resolution loss and uses residual connections to help prevent the network from becoming too deep.

Career Highlights

Xin Ye is associated with the University of Electronic Science and Technology of China. The supplied data credits him with 1 patent focused on image processing and phase unwrapping.

Collaborations

The supplied information identifies Jiang Qian as Xin Ye’s coworker. It does not specify her role in the patent or the nature of their collaboration.

Conclusion

Xin Ye’s listed patent applies convolutional neural networks and integral-based processing to fringe detection, repair, and phase unwrapping.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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