The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2026
Filed:
Apr. 26, 2024
University of Electronic Science and Technology of China, Chengdu, CN;
UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA, Chengdu, CN;
Abstract
Provided is a fringe line detection and phase unwrapping method and system based on an FL-Net convolutional neural network. The method includes: constructing the FL-Net convolutional neural network; detecting fringe lines of an input image by using the FL-Net convolutional neural network to obtain an image with detected fringe lines; performing circulation integral on the detected fringe lines to repair the detected fringe lines to thereby obtain an image with repaired fringe lines; performing path integral on the repaired fringe lines to unwrap the repaired fringe lines to thereby obtain an image with unwrapped fringe lines; and identifying error points of the unwrapped fringe lines by using the FL-Net convolutional neural network; and processing the error points. Specifically, an HDC method is used to replace a down-sampling method to avoid the loss of resolution, and residual connection is used to prevent the network from being too deep.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile