Xin Ran

Title: Xin Ran and Picometer-Scale Micro-Displacement Measurement

Introduction

Xin Ran is an inventor associated with Hefei University of Technology in Anhui, China. Her patent work includes a system designed to measure micro-displacements with picometer-scale resolution.

Latest Patents

The provided information lists one patent for Xin Ran: “Micro-displacement measurement system having picometer scale resolution and measurement method.” The invention combines a probe module, an optical demodulation path, a static lock-in amplification module, an upper-computer module, and a micro-displacement drive module.

The probe uses measurement and matching fiber Bragg grating (FBG) sensors, a precision stainless-steel needle tube, and an external support. The optical path includes an amplified spontaneous emission broadband light source, two circulators, and an InGaAs photodetector. Data acquisition and processing are handled by a data acquisition card and computer, while a piezoelectric ceramic nano-positioner, its driver, and a three-dimensional precision micro-motion platform provide controlled movement. The patent describes both the measurement system and its measurement method.

Career Highlights

Xin Ran’s listed patent focuses on combining optical sensing, signal processing, and precision motion control to measure extremely small displacements. The supplied information identifies Hefei University of Technology as her affiliated organization and lists 1 patent.

Collaborations

Haojie Xia and Fangfang Liu are identified as Xin Ran’s coworkers. The provided information does not specify their roles in the patent or the nature of their collaboration.

Conclusion

Xin Ran’s listed invention brings together FBG sensing, optical demodulation, and piezoelectric positioning in a system intended for picometer-scale micro-displacement measurement.