Santa Clara, CA, United States of America

Xiaozhou Che

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Applied Materals, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Xiaozhou Che. Retrieved from https://idiyas.com/inventor/xiaozhou-che-qxae9kj7

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Xiaozhou Che and Semiconductor Annealing Innovation.

Introduction

Xiaozhou Che is an inventor associated with Applied Materials, Inc., in Santa Clara, California. Her patent work addresses materials and processes for capping substrates during high-temperature annealing.

Latest Patents

Che is credited with 1 patent, titled “Interfacial Layer for Anneal Capping Layer.” The invention describes forming an interfacial layer on a substrate before depositing an amorphous carbon capping layer and annealing the substrate at approximately 1,500 degrees Celsius or higher. The interfacial layer may use amorphous silicon, amorphous silicon carbide, or amorphous silicon carbonitride, and may be approximately 5 to 100 nanometers thick. The method can be applied to planar and three-dimensional structures.

Career Highlights

Che’s patent reflects work on interface and capping-layer design for semiconductor processing. By incorporating a material related to an element of a chemical compound used in the substrate, the approach is intended to support annealing processes at very high temperatures.

Collaborations

Che’s listed coworkers include Yi Zheng and Qiang Ma. The patent is associated with Applied Materials, Inc.

Conclusion

Xiaozhou Che’s patent focuses on an interfacial-layer approach to capping substrates for high-temperature annealing, contributing to semiconductor process innovation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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