This inventor holds 1 USPTO granted patent. Top assignee: East China University of Science and Technology. Active years: 2015.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2015
Title: Innovations of Xiaoyin Hu in High-Temperature Measurement
Introduction
Xiaoyin Hu is a notable inventor based in Shanghai, China. He has made significant contributions to the field of high-temperature measurement technology. His innovative work focuses on developing tools that enhance the accuracy and efficiency of measuring structural deformations in various materials.
Latest Patents
Xiaoyin Hu holds a patent for an "Extensometer for measuring high-temperature structural deformations by magnification." This invention is designed to measure local deformations of both metal and non-metallic structures in real-time at high temperatures. The extensometer features a unique structure that includes two mounting block assemblies and extension bars that connect tightly to the surface of a test piece. The design allows for the deformation to be magnified and measured accurately, ensuring high linearity, resolution, and ease of installation.
Career Highlights
Xiaoyin Hu is affiliated with the East China University of Science and Technology, where he continues to advance research in measurement technologies. His work has been instrumental in providing solutions for industries that require precise measurements under extreme conditions.
Collaborations
Xiaoyin Hu has collaborated with colleagues such as Shandong Tu and Jiuhong Jia, contributing to the development of innovative measurement solutions. Their combined expertise enhances the research output and application of their inventions.
Conclusion
Xiaoyin Hu's contributions to high-temperature measurement technology exemplify the importance of innovation in engineering. His patented extensometer represents a significant advancement in the field, showcasing his dedication to improving measurement accuracy and efficiency.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile