The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2015
Filed:
Sep. 28, 2011
Shandong Tu, Shanghai, CN;
Jiuhong Jia, Shanghai, CN;
Xiaoyin HU, Shanghai, CN;
Fuzhen Xuan, Shanghai, CN;
Shandong Tu, Shanghai, CN;
Jiuhong Jia, Shanghai, CN;
Xiaoyin Hu, Shanghai, CN;
Fuzhen Xuan, Shanghai, CN;
East China University of Science and Technology, Shanghai, CN;
Abstract
The present invention relates to an extensometer for measuring high-temperature structural deformations by magnification, the structure of the extensometer is that: two mounting block assemblies are mounted at the planar ends of two extension bars respectively, the top ends of the extension bars are connected tightly with the surface of a test piece, two connecting pieces are mounted at the inner sides of the two mounting block assemblies respectively, a deformation magnifying mechanism and a sensor bracket are mounted on the connecting pieces, a sensor is mounted on the sensor bracket, two connecting pieces are mounted on a same straight line, and the straight line is parallel to a straight line at which the top ends of the two extension bars are located, so as to ensure that the deformation of the test piece is delivered equally to the deformation magnifying mechanism on the connecting pieces. The present invention can measure local deformations of various metal and non-metallic structures online for a long time in real time at high temperatures, extend the deformation of the test piece at high temperatures outside of the high temperature region, and measure the deformations after they are magnified through a mechanical magnifying mechanism, thus the present invention has a very high linearity, resolution, and accuracy, meanwhile has a light structure and a small size, and is easy to install.