Austin, TX, United States of America

Xiaowei Dai

This inventor holds 1 USPTO granted patent. Top assignee: The University of Texas System. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Xiaowei Dai. Retrieved from https://idiyas.com/inventor/xiaowei-dai-vgxpe19r

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Innovations in Non-Destructive Testing by Xiaowei Dai

Xiaowei Dai is an accomplished inventor based in Austin, TX (US). He has made significant contributions to the field of non-destructive testing of materials and structures. His innovative approach has led to the development of advanced devices and systems that enhance the reliability and efficiency of testing processes.

Latest Patents

Xiaowei Dai holds a patent for "Devices, systems, and methods for non-destructive testing of materials and structures." This patent outlines various devices and methods that are designed for the non-destructive testing of materials or structures. Notably, the technology may utilize a high-amplitude, air-coupled acoustic source, which is instrumental in performing non-destructive evaluations.

Career Highlights

Dai is affiliated with the University of Texas System, where he continues to advance research and innovation in his field. His work is characterized by a commitment to improving testing methodologies, which is crucial for ensuring the integrity of materials and structures in various applications.

Collaborations

Some of his notable coworkers include Jinying Zhu and Michael Haberman. Their collaborative efforts contribute to the ongoing research and development initiatives at the University of Texas System.

Conclusion

Xiaowei Dai's contributions to non-destructive testing represent a significant advancement in the field. His innovative patent and dedication to research continue to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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